Solid State Physics

Journal Article

Omotoso, E., Meyer, W. E., Sheppard, C. J., Igumbor, E. & Prinsloo, A. R. E. (2026): Analysis of Temperature‐Dependent Characteristics of Cr/P‐Doped Si Schottky Barrier Diodes before and after 5.4 MeV ²⁴¹ Am Irradiation. - physica status solidi (a), 223(2).

https://doi.org/10.1002/pssa.202500690

Journal Article

Igumbor, E., Ajeh, P., Mapasha, E., Omotoso, E. & Raji, A. (2026): Defect engineering with group III dopants in 2D monolayer SiC for improved electronic devices. - Materials Science in Semiconductor Processing, 207, 110465.

https://doi.org/10.1016/j.mssp.2026.110465